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18665920580
| 型号 | 厂商 | 描述 | 文档 | 询价 |
| SN74ABT8543DWRE4 | TI(德州仪器) | IC SCAN TEST DEVICE 28-SOIC |  |
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| SN74ABT8543DWR | TI(德州仪器) | IC SCAN TEST DEVICE 28-SOIC | |
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| SN74ABT8543DLR | TI(德州仪器) | IC SCAN TEST DEVICE 28-SSOP | |
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| SN74ABT18640DLRG4 | TI(德州仪器) | IC SCAN TEST DEVICE 18BIT 56SSOP | |
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| SN74ABT18640DLR | TI(德州仪器) | IC SCAN TEST DEVICE 18BIT 56SSOP | |
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| SN74ABT18504PMRG4 | TI(德州仪器) | IC SCAN TEST DEVICE 20BIT 64LQFP | |
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| SN74ABT18504PMR | TI(德州仪器) | IC SCAN TEST DEVICE 20BIT 64LQFP | |
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| SN74GTLP22034ZQLR | TI(德州仪器) | IC TXRX ADJ EDGE 8BIT 56BGA | |
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| SN74GTLP22033ZQLR | TI(德州仪器) | IC TXRX ADJ EDGE 8BIT 56BGA | |
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| SN74GTLP2034ZQLR | TI(德州仪器) | IC TXRX ADJ EDGE 8BIT 56BGA | |
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| SN74GTLP2033ZQLR | TI(德州仪器) | IC TXRX ADJ EDGE 8BIT 56BGA | |
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| SN74FB2041ARCRG3 | TI(德州仪器) | IC TXRX 7BIT TTL/BTL 52-QFP | |
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| SN74FB2041ARCR | TI(德州仪器) | IC TXRX 7BIT TTL/BTL 52-QFP | |
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| SN74FB2040RCR | TI(德州仪器) | IC TXRX 8BIT TTL/BTL 52-QFP | |
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| SN74FB2033KRCR | TI(德州仪器) | IC REGISTERED TXRX 8BIT 52-QFP | |
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| SN74FB2033ARCR | TI(德州仪器) | IC REGISTERED TXRX 8BIT 52-QFP | |
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| SN74FB2031RCR | TI(德州仪器) | IC TXRX ADDRESS/DATA 9BIT 52-QFP | |
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| SN74F283NSRE4 | TI(德州仪器) | IC FULL ADDER 4BIT BIN 16SO | |
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| SN74F283NSR | TI(德州仪器) | IC FULL ADDER 4BIT BIN 16SO | |
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| SN74BCT8374ANTE4 | TI(德州仪器) | IC SCAN TEST DEVICE W/FF 24-DIP | |
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| SN74BCT8374ANT | TI(德州仪器) | IC SCAN TEST DEVICE W/FF 24-DIP | |
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| SN74BCT8374ADWRE4 | TI(德州仪器) | IC SCAN TEST DEVICE W/FF 24-SOIC | |
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| SN74BCT8374ADWR | TI(德州仪器) | IC SCAN TEST DEVICE W/FF 24-SOIC | |
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| SN74BCT8373ANT | TI(德州仪器) | IC SCAN TEST DEVICE LATCH 24-DIP | |
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| SN74BCT8373ADWRE4 | TI(德州仪器) | IC SCAN TEST DEVICE LATCH 24SOIC | |
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| SN74BCT8373ADWR | TI(德州仪器) | IC SCAN TEST DEVICE LATCH 24SOIC | |
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| SN74BCT8245ANTE4 | TI(德州仪器) | IC SCAN TEST DEVICE TXRX 24-DIP | |
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| SN74BCT8245ANT | TI(德州仪器) | IC SCAN TEST DEVICE TXRX 24-DIP | |
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| SN74BCT8244ANTE4 | TI(德州仪器) | IC SCAN TEST DEVICE BUFF 24-DIP | |
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| SN74BCT8244ANT | TI(德州仪器) | IC SCAN TEST DEVICE BUFF 24-DIP | |
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| SN74BCT8240ANTE4 | TI(德州仪器) | IC SCAN TEST DEVICE BUFF 24-DIP | |
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| SN74BCT8240ANT | TI(德州仪器) | IC SCAN TEST DEVICE BUFF 24-DIP | |
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| SN74BCT8240ADWRE4 | TI(德州仪器) | IC SCAN TEST DEVICE BUFF 24-SOIC | |
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| SN74BCT8240ADWR | TI(德州仪器) | IC SCAN TEST DEVICE BUFF 24-SOIC | |
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| SN74BCT29854NT | TI(德州仪器) | IC TRANSCEIVER 1-9BIT 24DIP | |
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| SN74BCT29854DWRE4 | TI(德州仪器) | IC TRANSCEIVER 1-9BIT 24SOIC | |
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| SN74BCT29854DWR | TI(德州仪器) | IC TRANSCEIVER 1-9BIT 24SOIC | |
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| SN74BCT2414DWR | TI(德州仪器) | IC DECODER MEM DUAL 2-4 20-SOIC | |
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| SN74AS181ANTE4 | TI(德州仪器) | IC ARITHMETIC LOGIC UNIT 24DIP | |
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| SN74AS181ANT | TI(德州仪器) | IC ARITHMETIC LOGIC UNIT 24DIP | |
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| SN74AS181ADWRE4 | TI(德州仪器) | IC ARITHMETIC LOGIC UNIT 24-SOIC | |
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| SN74AS181ADWR | TI(德州仪器) | IC ARITHMETIC LOGIC UNIT 24-SOIC | |
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| SN74AS181ADWE4 | TI(德州仪器) | IC ARITHMETIC LOGIC UNIT 24-SOIC | |
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| SN74AS181ADW | TI(德州仪器) | IC ARITHMETIC LOGIC UNIT 24-SOIC | |
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| NB7L216MNR2 | ON(安森美) | IC RECEIVER/DRIVER DIFF 16-QFN | |
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| NB7L216MN | ON(安森美) | IC RECEIVER/DRIVER DIFF 16-QFN | |
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| NB4N527SMNR2 | ON(安森美) | IC DRVR/RCVR/BUFF/XLATOR 16-QFN | |
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| NB4N527SMN | ON(安森美) | IC DRVR/RCVR/BUFF/XLATOR 16-QFN | |
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| MC14490FG | ON(安森美) | IC BOUNCE ELIMINATOR 16SOEIAJ | |
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| MC14490FEL | ON(安森美) | IC BOUNCE ELIMINATOR 16SOEIAJ | |
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