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18665920580
| 型号 | 厂商 | 描述 | 文档 | 询价 |
| CD74AC283E | TI(德州仪器) | IC 4BIT BINARY FILL ADDER 16-DIP |  |
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| MC100EP17DTG | ON(安森美) | IC RCVR/DRV ECL QUAD DFF 20TSSOP | |
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| CD74HCT283E | TI(德州仪器) | IC BIN FULL 4BIT ADD W/CAR 16DIP | |
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| SY54016RMG-TR | Microchip(美国微芯) | IC RCVR/LINE DVR CML LV 8-MLF | |
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| MAX19005CCS+ | Maxim(美信) | IC DCL QUAD 300MHZ ATE 80TQFP | |
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| ISL55100AIRZ-T7A | Intersil(英特矽尔) | IC COMP DRVR/WINDOW 18V 72QFN | |
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| SN74ABT18502PM | TI(德州仪器) | IC SCAN-TEST-DEV/TXRX 64-LQFP | |
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| SN74ABTH182646APM | TI(德州仪器) | IC SCAN-TEST-DEV/TXRX 64-LQFP | |
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| SN74ABT18646PM | TI(德州仪器) | IC SCAN-TEST-DEV/TXRX 64-LQFP | |
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| SN74ABT18652PM | TI(德州仪器) | IC SCAN-TEST-DEV/TXRX 64-LQFP | |
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| 8V182512IDGGREP | TI(德州仪器) | IC ABT SCAN TEST DEV3.3V 64TSSOP | |
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| ISL55100BIRZ | Intersil(英特矽尔) | IC COMP DRVR/WINDOW 18V 72-QFN | |
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| SN74ABTH18652APM | TI(德州仪器) | IC SCAN-TEST-DEV/TXRX 64-LQFP | |
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| SN74ABTH18646APM | TI(德州仪器) | IC SCAN-TEST-DEV/TXRX 64-LQFP | |
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| SN74LVTH18652APM | TI(德州仪器) | IC TXRX/REG 18BIT 3.3V 64-LQFP | |
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| SN74LVTH182652APM | TI(德州仪器) | IC SCAN TEST DEVICE ABT 64-LQFP | |
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| SN74LVTH18646APM | TI(德州仪器) | IC SCAN-TEST-DEV/XCVR 64-LQFP | |
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| CSSTV32867SGKEREP | TI(德州仪器) | IC REGISTERED BUFF 26BIT 96LFBGA | |
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| SN74ABT18504PM | TI(德州仪器) | IC SCAN-TEST-DEV/TXRX 64-LQFP | |
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| SN74LVT8996IPWREP | TI(德州仪器) | IC 10B ADDRSBL SCAN PORT 24TSSOP | |
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| 74SSTVF32852ZKFR | TI(德州仪器) | IC RGSTRD BUFF 24-48BIT 114BGA | |
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| 74SSTUB32868AZRHR | TI(德州仪器) | IC REGSTR BUFFER 28-56BIT 176BGA | |
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| SN74SSTU32864GKER | TI(德州仪器) | IC 25BIT CONFIG REG BUFF 96LFBGA | |
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| 74SSTUB32865ZJBR | TI(德州仪器) | IC REGISTERED BUFFER 160-TFBGA | |
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| 74SSTUB32865AZJBR | TI(德州仪器) | IC REGSTR BUFF 28-56BIT 160NFBGA | |
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| 74SSTUB32868ZRHR | TI(德州仪器) | IC CONFIG REG BUFF 28BIT 176-BGA | |
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| SN74SSTU32864CZKER | TI(德州仪器) | IC 25BIT CONFIG REG BUFF 96-BGA | |
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| SN74SSTU32864ZKER | TI(德州仪器) | IC 25BIT CONFIG REG BUFF 96-BGA | |
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| SN74LVT8980AIDWREP | TI(德州仪器) | IC EMBEDDED TEST BUS CTRL 24SOIC | |
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| SN74ABT8652DL | TI(德州仪器) | IC SCAN-TEST-DEV/XCVR 28-SSOP | |
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| SN74ABT18640DL | TI(德州仪器) | IC SCAN-TEST-DEV/TXRX 56-SSOP | |
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| SN74ABTE16246DLR | TI(德州仪器) | IC 11-BIT I-WS BUS TXRX 48-SSOP | |
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| SN74ABT8543DW | TI(德州仪器) | IC SCAN TEST DEV/TXRX 28-SOIC | |
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| SN74SSTU32864DZKER | TI(德州仪器) | IC 25BIT CONFIG REG BUFF 96-BGA | |
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| SN74SSTV32852GKFR | TI(德州仪器) | IC BUFFER 24BIT-48BIT 114LFBGA | |
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| SN74SSTV32852ZKFR | TI(德州仪器) | IC BUFFER 24BIT-48BIT 114BGA | |
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| SN74LVT8986PM | TI(德州仪器) | IC LINK ADDRSS SCAN-PORT 64-LQFP | |
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| SN74LVT8996PWR | TI(德州仪器) | IC 10-BIT SCAN PORT XCVR 24TSSOP | |
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| SN74ABT18245ADLR | TI(德州仪器) | IC SCAN-TEST-DEV/TXRX 56-SSOP | |
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| SN74ABT8646DL | TI(德州仪器) | IC SCAN-TEST-DEV/XCVR 28-SSOP | |
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| SN74ABT8646DW | TI(德州仪器) | IC SCAN-TEST-DEV/XCVR 28-SOIC | |
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| SN74SSTEB32866ZWLR | TI(德州仪器) | IC BUFF CONFIG REG 25BIT 96BGA | |
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| CSSTV32852GKFREP | TI(德州仪器) | IC REGISTERED BUFF 114LFBGA | |
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| SN74ABT18245ADGGR | TI(德州仪器) | IC SCAN-TEST-DEV/TXRX 56-TSSOP | |
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| SN74LVTH182502APM | TI(德州仪器) | IC SCAN-TEST-DEV/XCVR 64-LQFP | |
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| SN74LVTH18504APM | TI(德州仪器) | IC SCAN-TEST-DEV/XCVR 64-LQFP | |
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| SN74LVTH18502APM | TI(德州仪器) | IC SCAN-TEST-DEV/XCVR 64-LQFP | |
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| SN74SSTUB32864ZKER | TI(德州仪器) | IC CONFIG REG BUFF 25BIT 96-BGA | |
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| 74SSTUB32866AZKER | TI(德州仪器) | IC CONFIG REG BUFF 25BIT 96-BGA | |
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| SN74SSTUB32866ZKER | TI(德州仪器) | IC CONFIG REG BUFF 25BIT 96-BGA | |
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